Investigation of Hump Behavior of Amorphous Indium-Gallium …
We investigate positive bias stress (PBS)-induced hump behavior in the subthreshold current region of the transfer characteristics of amorphous indium-gallium-zinc-oxide (a-IGZO) thin-film transistors (TFTs). We analyze the origin of hump creation as parasitic edge conduction using both experiment and simulation. Based on the simulated …Web
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